EMPIRICAL TEMPERATURE-DEPENDENCE OF THE REFRACTIVE-INDEX OF SEMICONDUCTORS

Authors
HERVE PJL VANDAMME LKJ
Citation
Pjl. Herve et Lkj. Vandamme, EMPIRICAL TEMPERATURE-DEPENDENCE OF THE REFRACTIVE-INDEX OF SEMICONDUCTORS, Journal of applied physics, 77(10), 1995, pp. 5476-5477
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
10
Year of publication
1995
Pages
5476 - 5477
Database
ISI
SICI code
0021-8979(1995)77:10<5476:ETOTRO>2.0.ZU;2-1