EXTRACTION OF THE MINORITY-CARRIER RECOMBINATION LIFETIME FROM FORWARD DIODE CHARACTERISTICS

Authors
VANHELLEMONT J SIMOEN E CLAEYS C
Citation
J. Vanhellemont et al., EXTRACTION OF THE MINORITY-CARRIER RECOMBINATION LIFETIME FROM FORWARD DIODE CHARACTERISTICS, Applied physics letters, 66(21), 1995, pp. 2894-2896
Citations number
6
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
21
Year of publication
1995
Pages
2894 - 2896
Database
ISI
SICI code
0003-6951(1995)66:21<2894:EOTMRL>2.0.ZU;2-L