FLICKER NOISE IN SUBMICRON METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS WITH NITRIDED GATE OXIDE

Authors
TRIANTIS DP BIRBAS AN ZIMMERMANN JJ
Citation
Dp. Triantis et al., FLICKER NOISE IN SUBMICRON METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS WITH NITRIDED GATE OXIDE, Journal of applied physics, 77(11), 1995, pp. 6021-6025
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
77
Issue
11
Year of publication
1995
Pages
6021 - 6025
Database
ISI
SICI code
0021-8979(1995)77:11<6021:FNISMF>2.0.ZU;2-3