SYNCHROTRON-RADIATION SOFT-X-RAY REFLECTOMETER AND ITS PHYSICS RESULTS

Authors
CUI MQ MIAO JW WANG J HUANG YY TANG ES SHAO JH XUE S XU ZL SUN JH
Citation
Mq. Cui et al., SYNCHROTRON-RADIATION SOFT-X-RAY REFLECTOMETER AND ITS PHYSICS RESULTS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 359(1-2), 1995, pp. 151-154
Citations number
6
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
359
Issue
1-2
Year of publication
1995
Pages
151 - 154
Database
ISI
SICI code
0168-9002(1995)359:1-2<151:SSRAIP>2.0.ZU;2-8
Abstract
A new home-made reflectometer has been installed at Beamline 3B1 of th e Beijing Synchrotron Radiation Facility (BSRF). It uses synchrotron r adiation as the light source and a multilayer mirror as the monochroma tor. With this system, the transmission spectrum of an Al film and the soft X-ray reflection spectrum of a Nb/Si multilayer mirror are obtai ned. The soft X-ray reflectivity up to 32% of the Nb/Si multilayer mir ror (41 layers, periodic thickness 13.45 nm and wavelength 17.59 nm) i s obtained.