THE APPLICATION OF THE X-RAY STANDING-WAVE METHOD TO STUDY NI C LAYERED STRUCTURES OBTAINED BY LASER-ASSISTED DEPOSITION/

Authors
CHERNOV VA CHKHALO NI DOLBNYA IP ZOLOTAREV KV
Citation
Va. Chernov et al., THE APPLICATION OF THE X-RAY STANDING-WAVE METHOD TO STUDY NI C LAYERED STRUCTURES OBTAINED BY LASER-ASSISTED DEPOSITION/, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 359(1-2), 1995, pp. 175-177
Citations number
4
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
359
Issue
1-2
Year of publication
1995
Pages
175 - 177
Database
ISI
SICI code
0168-9002(1995)359:1-2<175:TAOTXS>2.0.ZU;2-A
Abstract
The X-ray standing wave method using fluorescence yield made was appli ed to study the profile of the component-by-component distribution bet ween Ni and C layers in Ni/C layered structures produced by laser-assi sted deposition. The method of recurrent relationships was used to cal culate the standing wave electric field profile, and to reconstruct th e Ni deep distribution. Best fitting was obtained if the intermixing t hickness was equal to 3-4 Angstrom.