ABOUT SYSTEMATIC STUDYING OF CHEMICAL-SHIFTS IN X-RAY-EMISSION LINES WITH THE USE OF SYNCHROTRON-RADIATION

A physical basis is given for the advisability to study chemical shift s in X-ray emission lines with the use of synchrotron radiation. X-ray emission lines investigation is a comparatively old method but its fo rmer application was essentially restricted by the low intensities of traditional X-ray sources. This results in a low resolution. The appli cation of SR to excite X-ray fluorescence makes it possible to hope fo r a drastic increase in the accuracy of measurements of line positions , considerably higher resolution, lower background, decrease in the pr obe mass, and shortening of measurement time. A. systematic investigat ion of chemical combinations will be possible from Ca (Z = 20) practic ally to the end of the periodic table. The method of identification of a chemical combination can be worked out using the sum of a total of 8-10 emission line shifts. Some theoretical aspects of emission line c hemical shifts are presented. The factors determining the chemical shi ft value are the following: atom valence, combination spatial configur ation, and ligand ''size''. A series of chemical combinations is propo sed for systematic experimental investigations and theoretical calcula tions.