MEASUREMENTS OF THE ABSOLUTE SPECTRAL SENSITIVITY OF X-RAY SEMICONDUCTOR-DETECTORS IN THE PHOTON ENERGY-RANGE OF 1.5-15 KEV USING WHITE SR BEAM OF THE VEPP-3 STORAGE-RING

Results of measurements of the absolute spectral sensitivity of silico n semiconductor detectors in the X-ray quanta energy range of 1.5-15 k eV are presented. The detectors, being calibrated, were placed into th e direct ''white'' synchrotron radiation (SR) beam from the VEPP-3 sto rage ring. The spectrum of X-radiation at the entrance window of the d etectors was changed by using sets of calibrated filters, as well as b y varying the energy of the electrons in the storage ring. The possibi lity of accurate calculation of the SR spectrum on the calibrated dete ctor under its irradiation in different conditions allowed us to deter mine the detector spectral sensitivity from a set of integral equation s connecting the spectral sensitivity to the registered detector curre nts. The analysis of possible experimental errors indicates that the a bsolute spectral sensitivity of the detectors was restored with an acc uracy of not worse than 10% in the total photon energy range under the study.