N. Tanaka et al., HIGH-PRECISION MASS-SPECTROMETRIC ANALYSIS OF ISOTOPIC ABUNDANCE RATIOS IN NITROUS-OXIDE BY DIRECT-INJECTION OF N2O, International journal of mass spectrometry and ion processes, 142(3), 1995, pp. 163-175
Citations number
12
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
This paper presents the technical and theoretical background of a tech
nique for directly determining the nitrogen and oxygen isotopic compos
ition of N2O by measuring simultaneously the m/z 44, 45, and 46 beam i
ntensities on a gas source ratio mass spectrometer. Mass interferences
are caused by any CO2 contaminant as CO2 has the same molecular masse
s as N2O. Any small amount of CO2 remaining in the sample can be corre
cted for by measuring the ratio of m/z 12 to 14 or m/z 12 to 44 ratio
in the sample. Under certain source conditions, NO2 is produced in the
ion source, causing a mass interference at m/z 46, NO2 production in
the source can be corrected for by establishing an NO2 slope correctio
n factor through measuring the ratio of m/z 46 to 44 in the sample at
various ion source pressures. The production of NO2 can be totally eli
minated by increasing the draw-out voltage in the source to a value si
milar to that used for hydrogen isotope analysis. Experiments were car
ried out on both a Finnigan MAT251 and a Finnigan MAT252. Delta values
for oxygen and nitrogen isotope abundances were obtained with an inte
rnal precision of better than 0.08 permil and 0.02 permil, respectivel
y, on samples as small as 3 mu mol on both instruments.