IDEAL BEHAVIOR AT ILLUMINATED SEMICONDUCTOR-LIQUID JUNCTIONS

Citation
Y. Rosenwaks et al., IDEAL BEHAVIOR AT ILLUMINATED SEMICONDUCTOR-LIQUID JUNCTIONS, Journal of physical chemistry, 99(20), 1995, pp. 7871-7874
Citations number
31
Categorie Soggetti
Chemistry Physical
ISSN journal
00223654
Volume
99
Issue
20
Year of publication
1995
Pages
7871 - 7874
Database
ISI
SICI code
0022-3654(1995)99:20<7871:IBAISJ>2.0.ZU;2-D
Abstract
Photocurrent-voltage characteristics that show a nearly ideal dependen ce on the concentration of a nonadsorbed, outer-sphere redox acceptor (cobaltocenium) have been achieved with a novel photoelectrode structu re that consists of a thin (30-50 Angstrom) epilayer of GaInP2 deposit ed on a thick (5000 Angstrom) p-GaAs epilayer. The thin GaInP2 layer p roduces nearly perfect passivation of the GaAs surface (resulting in a surface recombination velocity <200 cm/s), while at the same time per mitting efficient electron transfer via field-assisted tunneling and/o r thermionic emission, The electron transfer kinetics, as characterize d by quenching of the GaAs photoluminescence, also shows a systematic acceptor concentration dependence. An unambiguous concentration,depend ence of the photocurrent and electron transfer kinetics has not been p reviously reported at semiconductor-liquid junctions.