Photocurrent-voltage characteristics that show a nearly ideal dependen
ce on the concentration of a nonadsorbed, outer-sphere redox acceptor
(cobaltocenium) have been achieved with a novel photoelectrode structu
re that consists of a thin (30-50 Angstrom) epilayer of GaInP2 deposit
ed on a thick (5000 Angstrom) p-GaAs epilayer. The thin GaInP2 layer p
roduces nearly perfect passivation of the GaAs surface (resulting in a
surface recombination velocity <200 cm/s), while at the same time per
mitting efficient electron transfer via field-assisted tunneling and/o
r thermionic emission, The electron transfer kinetics, as characterize
d by quenching of the GaAs photoluminescence, also shows a systematic
acceptor concentration dependence. An unambiguous concentration,depend
ence of the photocurrent and electron transfer kinetics has not been p
reviously reported at semiconductor-liquid junctions.