TIME-OF-FLIGHT, ION-BEAM SURFACE-ANALYSIS FOR IN-SITU CHARACTERIZATION OF THIN-FILM GROWTH-PROCESSES

Authors
KRAUSS AR AUCIELLO O SCHULTZ JA
Citation
Ar. Krauss et al., TIME-OF-FLIGHT, ION-BEAM SURFACE-ANALYSIS FOR IN-SITU CHARACTERIZATION OF THIN-FILM GROWTH-PROCESSES, MRS bulletin, 20(5), 1995, pp. 18-23
Citations number
33
Categorie Soggetti
Material Science","Physics, Applied
Journal title
MRS bulletin → ACNP
ISSN journal
08837694
Volume
20
Issue
5
Year of publication
1995
Pages
18 - 23
Database
ISI
SICI code
0883-7694(1995)20:5<18:TISFIC>2.0.ZU;2-X