SINGLE EVENT EFFECTS ON THE ELECTRONIC EQ UIPMENT OF THE ARIANE LAUNCHER

Authors
Citation
J. Bourrieau, SINGLE EVENT EFFECTS ON THE ELECTRONIC EQ UIPMENT OF THE ARIANE LAUNCHER, Onde electrique, 75(3), 1995, pp. 38-43
Citations number
NO
Categorie Soggetti
Telecommunications,"Engineering, Eletrical & Electronic
Journal title
ISSN journal
00302430
Volume
75
Issue
3
Year of publication
1995
Pages
38 - 43
Database
ISI
SICI code
0030-2430(1995)75:3<38:SEEOTE>2.0.ZU;2-E
Abstract
The single events effects induced by heavy ions in VLSI devices, produ ce functional failures of electronic system in space. The main results of a study performed in order to define this risk for new equipments of the ARIANE launcher are given.