FLASH X-RAY AND HEAVY-IONS TRANSIENT EFFE CTS SIMULATION WITH LASER -INTEREST, LIMITATIONS, NEW DEVELOPMENTS

Authors
GAILLARD R
Citation
R. Gaillard, FLASH X-RAY AND HEAVY-IONS TRANSIENT EFFE CTS SIMULATION WITH LASER -INTEREST, LIMITATIONS, NEW DEVELOPMENTS, Onde electrique, 75(3), 1995, pp. 77-79
Citations number
NO
Categorie Soggetti
Telecommunications,"Engineering, Eletrical & Electronic
Journal title
Onde electrique → ACNP
ISSN journal
00302430
Volume
75
Issue
3
Year of publication
1995
Pages
77 - 79
Database
ISI
SICI code
0030-2430(1995)75:3<77:FXAHTE>2.0.ZU;2-L
Abstract
Q Switched solid state laser (glass, YAG, YLF) are often used to simul ate transient radiation effects on electronics (TREE). Ultrashort puls es (ps or fs duration) generation by tunable laser allow us to simulat e linear energy transfer (LET) and penetration depth of heavy ions wit h precise spatial location and low time jitter. Simulation limitations related to metallisation shadows and different ionisation profiles ar e discussed.