TOTAL-REFLECTION XRF ANALYSIS OF IMPURITIES IN ICE

Authors
ARENA LE SANCHEZ HJ NASELLO O
Citation
Le. Arena et al., TOTAL-REFLECTION XRF ANALYSIS OF IMPURITIES IN ICE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 100(1), 1995, pp. 196-198
Citations number
16
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
100
Issue
1
Year of publication
1995
Pages
196 - 198
Database
ISI
SICI code
0168-583X(1995)100:1<196:TXAOII>2.0.ZU;2-S
Abstract
In this work, the Total-Reflection X-Ray Fluorescence Analysis techniq ue, induced by Synchrotron Radiation (SRTRA), was used to determine tr aces of elements in ice bicrystals. Samples were obtained from a 10(-2 ) M water solution of HOK. The concentrations of K (Z = 19) in small v olumes (< 5 mu l) of the ice bicrystals were measured. With these valu es of concentration the effective distribution coefficient K-eff was e stimated.