Multilayer systems comprising either Al or Cu bonded to sapphire have
been used to evaluate stress redistribution effects around cracks, cau
sed by dip in the metal. Single precracks have been introduced into th
e outermost sapphire layer and strain distributions measured around th
ose cracks upon loading. Both moire interferometry and (Cr3+) fluoresc
ence piezospectroscopy have been used for that purpose. Finite element
calculations of the plastic zone size, L(s), the crack opening displa
cement, delta, and the strains have been made, with the yield strength
s of the metals, sigma(o), regarded as unknowns. Comparison of L(s) or
delta with the measurements establishes sigma(o). Once the relevant y
ield strengths have been determined, the calculated stresses and strai
ns (as redistributed by slip in the metal layer) are found to be in re
asonable correspondence with the values measured by either moire inter
ferometry or piezospectroscopy. Some small discrepancies remain, which
have yet to be explained.