DETERMINATION OF THE OPTICAL-PHASE FUNCTION OF AG AND MN FILMS

The optical phase function F = 2 gamma(1) - beta(1) - beta(2) Of silve r and manganese thin films, which is used as an upper component in a m ultiple-beam air/wedge at reflection, and is responsible for the forma tion of transmission-like fringes at reflection is determined. The dep endence of such a redistribution on thickness has been investigated fo r Ag films ranging from 80 Angstrom to 470 Angstrom and for Mn films f rom 155 Angstrom to 685 Angstrom at a wavelength of 5461 Angstrom. Two methods have been performed, the first is based on computing the inte nsity distribution for different values of F and Delta, and comparing it with the experimental microphotometer tracing. The second method is based on computing the phase at both I-max and I-min.