The crystallization behaviour of amorphous Ge1-xSbx thin films, deposi
ted by sputtering, at three compositions: x = 0.68, 0.73 and 0.84 have
been studied. The crystallization has been induced by annealing in va
cuum and monitored by optical absorption. Samples have been characteri
zed by X-ray diffraction , energy-dispersive X-ray and transmission el
ectron microscopy. The crystallization temperature, Theta(c), is compo
sition-dependent and decreases with Sb content. In the crystallization
process, three composition intervals can be distinguished. At high Ge
content, x less than or equal to 0.6, crystallization leads to two se
parated phases, c-Ge and c-Sb. At x similar or equal to 0.68 Sb crysta
llizes in a first step followed by Ge crystallization At x greater tha
n or equal to 0.73, only Sb crystallizes and for the eutectic composit
ion, x = 0.84, Sb crystallizes with [0 0 1] zone axis perpendicular to
the film surface as found in pure Sb films.