HIGH-RESOLUTION X-RAY-DIFFRACTION PROFILE ANALYSIS OF A COLD-ROLLED POLYCRYSTALLINE ALUMINUM

Authors
JI N LEBRUN JL MARTY B BESSIERE M CHENAL B
Citation
N. Ji et al., HIGH-RESOLUTION X-RAY-DIFFRACTION PROFILE ANALYSIS OF A COLD-ROLLED POLYCRYSTALLINE ALUMINUM, Journal of materials science letters, 14(9), 1995, pp. 674-675
Citations number
7
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
14
Issue
9
Year of publication
1995
Pages
674 - 675
Database
ISI
SICI code
0261-8028(1995)14:9<674:HXPAOA>2.0.ZU;2-L