The adsorption, reaction and etching of Cu(100) by Cl-2 was studied us
ing temperature programmed desorption (TPD) and low energy electron di
ffraction (LEED), and the results were compared with recent results fo
r Br-2. Although the general etching mechanism was the same for both g
ases (adsorption rate limited Cu halide formation followed by halide s
ublimation), significant differences between the behavior of Cl-2 and
Br-2 were observed. The desorption of CuCl was characterized by a sing
le zero order sublimation peak, independent of CuCl coverage, while li
miting the CuBr coverage resulted in a desorption peak at temperatures
lower than a prediction based on vapor pressure data of all known pha
ses of CuBr. In addition, Cl-2 was found to be at least an order of ma
gnitude less reactive than Br, towards halide formation. For both Cl-2
and Br-2, the halide formation rate reversibly decreased with increas
ing reaction temperature. However, for Br-2, but not Cl-2, annealing a
chemisorbed halogen layer prior to further reaction irreversibly incr
eased the halide formation rate. Structural differences between CuCl a
nd CuBr on Cu(100) were also observed. For CuCl, LEED data suggested t
hat highly faceted crystallites form at 325 K and remain Stable until
desorption, while LEED data for CuBr reveal a compressed epitaxial (11
1) layer that disorders below 400 K and then desorbs. The implications
of these differences on etching and oxidation processes are discussed
.