ELECTRONIC BAND-STRUCTURE OF DC-SPUTTERED BI2SR2CACU2O8+DELTA

Citation
J. Ma et al., ELECTRONIC BAND-STRUCTURE OF DC-SPUTTERED BI2SR2CACU2O8+DELTA, Solid state communications, 95(2), 1995, pp. 85-89
Citations number
22
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
95
Issue
2
Year of publication
1995
Pages
85 - 89
Database
ISI
SICI code
0038-1098(1995)95:2<85:EBODB>2.0.ZU;2-E
Abstract
We have performed angle-resolved photoemission measurements on cleaved thin films of Bi2Sr2CaCu2O8+delta in the normal state. We find that t he valence band features, the Fermi edge, and the core levels are iden tical to those reported for cleaved single crystals. The results indic ate that cleaved thin films can be used to study cuprate materials in a wider part of the phase diagram than accessible by using single crys tal samples.