FREE-ION YIELD IN LIQUID ARGON AT LOW-LET

Authors
MOZUMDER A
Citation
A. Mozumder, FREE-ION YIELD IN LIQUID ARGON AT LOW-LET, Chemical physics letters, 238(1-3), 1995, pp. 143-148
Citations number
35
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
Journal title
Chemical physics letters → ACNP
ISSN journal
00092614
Volume
238
Issue
1-3
Year of publication
1995
Pages
143 - 148
Database
ISI
SICI code
0009-2614(1995)238:1-3<143:FYILAA>2.0.ZU;2-3
Abstract
A re-encounter model is proposed for electron-ion recombination on low -LET tracks in liquid argon. Consistency with measured escape probabil ity for fields > 1 kV cm(-1) requires an encounter recombination proba bility approximate to 0.01. The initial e-ion separation (approximate to 1500-1800 nm) is reconciled with thermalization by elastic collisio ns. Due to homogeneous recombination the experimental values fall belo w the calculated ones for fields less than approximate to 1 kV cm(-1).