The basic principle of the generation of high resolution complex targe
t microwave images from scattered fields is outlined, and the derivati
on of so-called target characteristic parameters as well as target cha
racteristic polarizations is described. Special emphasis is given to t
he analysis of localized scattering centres. A fast procedure for the
generation of two-dimensional microwave images under real-time conditi
ons is explained in detail. Finally, two methods for studying bistatic
scattering effects on a monostatic measurement range are introduced.