HIGH-RESOLUTION X-RAY SPECTROSCOPY OF A SUBPICOSECOND-LASER-PRODUCED SILICON PLASMA

Citation
Ay. Faenov et al., HIGH-RESOLUTION X-RAY SPECTROSCOPY OF A SUBPICOSECOND-LASER-PRODUCED SILICON PLASMA, Physical review. A, 51(5), 1995, pp. 3529-3533
Citations number
22
Categorie Soggetti
Physics
Journal title
ISSN journal
10502947
Volume
51
Issue
5
Year of publication
1995
Pages
3529 - 3533
Database
ISI
SICI code
1050-2947(1995)51:5<3529:HXSOAS>2.0.ZU;2-T