A study of silicon anisotropic etching in SF6/Ar/O-2-based plasma has
been performed in a surfatron reactor excited at 2.45 GHz with indepen
dent radio-frequency biasing at 13.56 MHz. Emphasis is put on the comp
arison of profiles and etch rates obtained with different percentages
of oxygen added to the mixture as a function of substrate temperature.
Good results are obtained with 15% O-2 and a substrate temperature of
-30 degrees C, allowing a depth of 100 mu m to be etched.