We present a new technology to realize thin film strain gauges on poly
mer films by cathodic sputtering. We show that high resistance values
on small surfaces (>1000 Omega mm(-2)) are feasible and we propose a n
ew method to compensate for the test structure creep. Thanks to an ade
quate combination of thin film materials (NiCrSi and CuNiMn), accurate
weighing measurements (<10(-4) of the full scale of the sensor) are o
btained without needing to change the gauge geometry.