P. Guzman et al., CHARACTERIZATION OF VARIABILITY IN THE FUNGUS PHAEOISARIOPSIS-GRISEOLA SUGGESTS COEVOLUTION WITH THE COMMON BEAN (PHASEOLUS-VULGARIS), Phytopathology, 85(5), 1995, pp. 600-607
Angular leaf spot (ALS) disease of common bean (Phaseolus vulgaris) is
caused by the imperfect fungus Phaeoisariopsis griseola and severely
reduces bean yields in tropical and subtropical countries. Breeding fo
r disease resistance has been difficult because there is substantial p
athogenic variation among fungal isolates. Random amplified polymorphi
c DNA (RAPD) markers were used to characterize 62 P. griseola isolates
from three countries (Malawi, the United States, and Brazil). The gen
e pool of the bean plants from which the isolates were obtained was de
termined by isozyme and phaseolin analysis. Eleven primers generated r
eproducible and distinct RAPD patterns that divided the P. griseola is
olates into two major groups. Group 1 (Andean) isolates were generally
recovered from Andean gene pool materials, whereas group 2 (Mesoameri
can) isolates were recovered from Mesoamerican materials. Phaeoisariop
sis griseola isolates representing groups 1 and 2 were inoculated onto
selected Andean and Mesoamerican bean genotypes. Group 1 isolates wer
e more pathogenic on Andean beans, whereas group 2 isolates were more
pathogenic on Mesoamerican beans, RAPD and pathogenicity data suggest
that groups 1 and 2 may have originated in the Andes and Mesoamerica,
respectively, and that coevolution of the P. griseola fungus and its c
ommon bean host has resulted in increased levels of disease in this ho
st-pathogen interaction. The results have implications in development
of ALS breeding strategies.