TECHNIQUE FOR REDUCING THE MASKING PROBABILITY IN TRANSITION COUNT TESTING

Authors
Citation
K. Lai et Pk. Lala, TECHNIQUE FOR REDUCING THE MASKING PROBABILITY IN TRANSITION COUNT TESTING, International journal of electronics, 78(4), 1995, pp. 707-713
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00207217
Volume
78
Issue
4
Year of publication
1995
Pages
707 - 713
Database
ISI
SICI code
0020-7217(1995)78:4<707:TFRTMP>2.0.ZU;2-G
Abstract
A two-phase technique-to reduce-the masking probability of transition count testing is presented. The technique can reduce the probability o f masking by 50% compared with the traditional transition count testin g scheme. The first phase of the technique is identical to the traditi onal scheme. In the second-phase, the last bit of a response pattern i s stored and compared with that of the reference pattern. Thus, the pr oposed technique requires only minimal overhead to reduce the masking probability.