K. Lai et Pk. Lala, TECHNIQUE FOR REDUCING THE MASKING PROBABILITY IN TRANSITION COUNT TESTING, International journal of electronics, 78(4), 1995, pp. 707-713
A two-phase technique-to reduce-the masking probability of transition
count testing is presented. The technique can reduce the probability o
f masking by 50% compared with the traditional transition count testin
g scheme. The first phase of the technique is identical to the traditi
onal scheme. In the second-phase, the last bit of a response pattern i
s stored and compared with that of the reference pattern. Thus, the pr
oposed technique requires only minimal overhead to reduce the masking
probability.