ELIMINATION OF INTERFERENCE EFFECTS FROM PHOTOINDUCED-TRANSMISSION DECAY CURVES OF THIN SILICON FILMS

Citation
M. Kubinyi et al., ELIMINATION OF INTERFERENCE EFFECTS FROM PHOTOINDUCED-TRANSMISSION DECAY CURVES OF THIN SILICON FILMS, Applied optics, 34(16), 1995, pp. 2949-2954
Citations number
8
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
34
Issue
16
Year of publication
1995
Pages
2949 - 2954
Database
ISI
SICI code
0003-6935(1995)34:16<2949:EOIEFP>2.0.ZU;2-R
Abstract
The effects of interference on the photoinduced-absorption signals of thin absorbing films have been studied by recording the picosecond pho toinduced-absorption decay curves of an amorphous and a polycrystallin e silicon film and applying various probe-beam wavelengths and angles of incidence, The normalized decay curves measured at close to normal incidence have been found to depend strongly on the probe-beam wavelen gth. By contrast the decay curves obtained at the Brewster angle of in cidence have shown a satisfactory coincidence. Theoretical calculation s for the photoinduced changes of the transmittance of the film have b een performed. These calculations prove that at normal incidence the c ontributions of the photoinduced changes of the absorption coefficient Delta alpha and of the refractive index Delta n to the change in the transmittance Delta T are comparable, whereas when the Brewster angle arrangement is employed, Delta T is proportional to Delta alpha and th e effect of the change in the refractive index is negligible.