A universal parameter quantitatively characterizing the morphology of
branching fungal mycelium is suggested, namely, the fractal dimension
D. A program for generating of fractals with varying fractal dimension
has been developed, together with a method for computation of fractal
dimension of fungal mycelium input to the computer using scanner. Thi
s parameter of fungal morphology is useful for creation of an effectiv
e system of express control and handling of biotechnology processes an
d characterizing of new strains of biological cultures obtained by sel
ection.