RAMAN MICROPROBE ANALYSIS OF PATTERNED HIGH-TC SUPERCONDUCTOR (YBCO) THIN-FILMS

Citation
J. Jimenez et al., RAMAN MICROPROBE ANALYSIS OF PATTERNED HIGH-TC SUPERCONDUCTOR (YBCO) THIN-FILMS, Materials research bulletin, 30(6), 1995, pp. 771-778
Citations number
19
Categorie Soggetti
Material Science
Journal title
ISSN journal
00255408
Volume
30
Issue
6
Year of publication
1995
Pages
771 - 778
Database
ISI
SICI code
0025-5408(1995)30:6<771:RMAOPH>2.0.ZU;2-7
Abstract
MicroRaman spectroscopy is used for studying patterning induced struct ural damage in PLD (Pulsed Laser Deposition) YBaCuO High T-c supercond uctor thin films. The study was focused on the oxygen sublattice vibra tions, which give information about different structural aspects of th e films. A significant oxygen loss and the presence of residual stress es for laser ablation and ion etching patterning procedures were found . No appreciable consequences at the microRaman resolution scale were detected when patterning was done by wet etching with EDTA (Ethylene D iamine Tetra Acetic Acid).