J. Jimenez et al., RAMAN MICROPROBE ANALYSIS OF PATTERNED HIGH-TC SUPERCONDUCTOR (YBCO) THIN-FILMS, Materials research bulletin, 30(6), 1995, pp. 771-778
MicroRaman spectroscopy is used for studying patterning induced struct
ural damage in PLD (Pulsed Laser Deposition) YBaCuO High T-c supercond
uctor thin films. The study was focused on the oxygen sublattice vibra
tions, which give information about different structural aspects of th
e films. A significant oxygen loss and the presence of residual stress
es for laser ablation and ion etching patterning procedures were found
. No appreciable consequences at the microRaman resolution scale were
detected when patterning was done by wet etching with EDTA (Ethylene D
iamine Tetra Acetic Acid).