X-RAY-DETECTION WITH SUBMICRON IMPACT ACCURACY

Authors
SCHMIDT KH BOGNER M BUSCHHORN G KOTTHAUS R RZEPKA M WROBLEWSKI T
Citation
Kh. Schmidt et al., X-RAY-DETECTION WITH SUBMICRON IMPACT ACCURACY, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 359(3), 1995, pp. 634-636
Citations number
4
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
Journal title
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment → ACNP
ISSN journal
01689002
Volume
359
Issue
3
Year of publication
1995
Pages
634 - 636
Database
ISI
SICI code
0168-9002(1995)359:3<634:XWSIA>2.0.ZU;2-6
Abstract
Utilizing a commercial optical CCD camera with the smallest pixel size presently available (6.8 x 6.8 mu m(2)) we have measured impact accur acies of 0.9 mu m (rms) for 15 keV synchrotron radiation in direct pho ton counting mode. Of crucial importance was diffusion spreading of th e deposited charge such that by centroid reconstruction interpolation between discrete pixel coordinates was possible.