K. Kimoto et al., ELEMENTAL MAPPING USING A FIELD-EMISSION TRANSMISSION ELECTRON-MICROSCOPE WITH AN IMAGING FILTER, Journal of Electron Microscopy, 44(2), 1995, pp. 86-90
An imaging filter has been equipped on a field emission transmission e
lectron microscope (FE-TEM) when used for elemental mapping of 3d meta
ls like chromium and iron. High spatial resolution of the elemental ma
ps can be obtained because of the reduction of the chromatic broadenin
g owing to the narrowed energy window and small collection angle, The
spatial resolution is estimated as about 1 nm when using a multilayer
specimen, Elemental mapping of stainless steels is also performed and
the obtained elemental maps of chromium and iron agree fairly well wit
h the results obtained by energy-dispersive X-ray spectroscopy (EDX).