RECENT ADVANCESA IN IN-SITU AFM - IN-SITU MONITORING OF ELECTRODE SURFACE-REACTIONS USING ATOMIC-FORCE MICROSCOPE

Citation
M. Koinuma et K. Uosaki, RECENT ADVANCESA IN IN-SITU AFM - IN-SITU MONITORING OF ELECTRODE SURFACE-REACTIONS USING ATOMIC-FORCE MICROSCOPE, Denki Kagaku Oyobi Kogyo Butsuri Kagaku, 63(2), 1995, pp. 92-98
Citations number
23
Categorie Soggetti
Electrochemistry
ISSN journal
03669297
Volume
63
Issue
2
Year of publication
1995
Pages
92 - 98
Database
ISI
SICI code
0366-9297(1995)63:2<92:RAIIA->2.0.ZU;2-K