HIGH-RESOLUTION HYDROGEN PROFILING IN SUPERCONDUCTING MATERIALS BY ION-BEAM ANALYSIS (ERB-EXB)

Authors
ROUX B CHEVARIER A CHEVARIER N WYBOURN B ANTOINE C BONIN B BOSLAND P CANTACUZENE S
Citation
B. Roux et al., HIGH-RESOLUTION HYDROGEN PROFILING IN SUPERCONDUCTING MATERIALS BY ION-BEAM ANALYSIS (ERB-EXB), Vacuum, 46(7), 1995, pp. 629-632
Citations number
25
Categorie Soggetti
Physics, Applied
Journal title
Vacuum → ACNP
ISSN journal
0042207X
Volume
46
Issue
7
Year of publication
1995
Pages
629 - 632
Database
ISI
SICI code
0042-207X(1995)46:7<629:HHPISM>2.0.ZU;2-Q
Abstract
Most superconducting r.f. cavities are made of Nb. Their performance i s closely related to the purity of Nb's surface. Adequate characteriza tion tools are needed to qualify the cavity surface. An improvement of the classical ERD method of hydrogen analysis has been achieved using an electromagnetic (EXB) filter. Thus, the depth resolution in Nb was 17 nm. This method was used to select the best procedure for bulk and thin coated Nb cavity fabrication.