METAL INP THIN-FILM REACTIONS - STUDIES USING MASS AND ENERGY-DISPERSIVE RECOIL SPECTROMETRY/

Citation
Hj. Whitlow et al., METAL INP THIN-FILM REACTIONS - STUDIES USING MASS AND ENERGY-DISPERSIVE RECOIL SPECTROMETRY/, Vacuum, 46(7), 1995, pp. 737-738
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
VacuumACNP
ISSN journal
0042207X
Volume
46
Issue
7
Year of publication
1995
Pages
737 - 738
Database
ISI
SICI code
0042-207X(1995)46:7<737:MITR-S>2.0.ZU;2-X
Abstract
Preliminary results are presented from a study of transition metal/InP reactions using mass and energy dispersive recoil spectrometry. 50 nm films of Ni, Pd and Pt were evaporated on InP substrates, heat treate d in vacuum and subsequently analysed with X-ray diffraction and mass and energy dispersive recoil spectrometry using 77 MeV(127)I(10+) ions as projectiles. The unique information on the elemental distributions in the Surface layers which can be obtained using the latter techniqu e has allowed us to follow the progress of the solid state reactions. These reactions are quite different for the three metals studied, with significant P loss in the Pd/InP case.