CHARACTERISTICS OF THIN-FILM PROBE WITH TEMPERATURE COMPENSATION

Analytical and experimental studies were carried out using an electrol ytic technique to measure the thickness of a thin liquid film. It was found that the relationship between the thickness and the output volta ge depends strongly on the area and the configuration of the probe. Fo r a specific configuration and area of the probe, the output voltage d epends on both the thickness and the temperature of the liquid. In ord er to achieve the output voltage as a unique function of the film thic kness, the automatic temperature compensation method was applied. Comp arisons were also made with analytical solutions. Good agreement was o btained.