CHARACTERIZATION OF SPINEL-TYPE COBALT AND NICKEL-OXIDE THIN-FILMS BYX-RAY NEAR GRAZING DIFFRACTION, TRANSMISSION AND REFLECTANCE SPECTROSCOPIES, AND CYCLIC VOLTAMMETRY

The application of three analytical techniques, x-ray near grazing dif fraction, infrared transmission and reflectance spectroscopy, and W-vi sible-near-infrared reflectance spectroscopy, to the characterization of cobalt cobaltite, Co3O4, and of nickel cobaltite, NiCo2O4 films, is reported. Thin films of Co3O4 and NiCo2O4, in a 10-1000 nm thickness range were prepared by two methods: spraying and sputtering. Character istic spectra and thickness limits are discussed based on theoretical considerations. Corresponding cyclic voltammograms are presented and d iscussed. Among the four methods of investigation of the cationic comp osition of the films, cyclic voltammetry appears to be the least sensi tive.