Ak. Panda et al., COMPUTER-AIDED STUDIES ON THE WIDE-BAND MICROWAVE CHARACTERISTICS OF A SILICON DOUBLE AVALANCHE REGION (DAR) DIODE, Semiconductor science and technology, 10(6), 1995, pp. 854-864
The results of accurate and realistic high-frequency numerical analysi
s of a silicon DAR (double avalanche region) diode indicate some uniqu
e and useful microwave characteristics. The DAR diode under any struct
ural condition exhibits multiband microwave negative resistance charac
teristics between 8 and 350 GHz which would make it possible to realiz
e wide-band microwave oscillations (8 to 350 GHz) from any single DAR
diode with a multituning facility. The negative resistance space distr
ibution profiles of the diode at high frequencies of operation shows n
ear sinusoidal variation, which suggests that a DAR diode can have sev
eral optimum diode widths for generation of a particular frequency. Th
e results have been explained on the basis of computation of the total
avalanche delay produced in both avalanche regions and transit time d
elay produced in the drift region.