QUALITY ENGINEERING (TAGUCHI METHODS) FOR THE DEVELOPMENT OF ELECTRONIC CIRCUIT-TECHNOLOGY

Authors
Citation
G. Taguchi, QUALITY ENGINEERING (TAGUCHI METHODS) FOR THE DEVELOPMENT OF ELECTRONIC CIRCUIT-TECHNOLOGY, IEEE transactions on reliability, 44(2), 1995, pp. 225-229
Citations number
NO
Categorie Soggetti
Computer Sciences","Engineering, Eletrical & Electronic","Computer Science Hardware & Architecture","Computer Science Software Graphycs Programming
ISSN journal
00189529
Volume
44
Issue
2
Year of publication
1995
Pages
225 - 229
Database
ISI
SICI code
0018-9529(1995)44:2<225:QE(MFT>2.0.ZU;2-8
Abstract
Most technology development engineers use traditional reliability engi neering methods to calibrate the objective functions of their new syst ems to meet various marketing requirements. These methods are marginal ly effective in reducing failure rates. To fundamentally improve quali ty, the engineers need to focus on improving the robustness bf the bas ic functions of their new product or process technologies and apply pa rameter design methods to make the basic functions approach the ideal functions under real conditions. These robust design activities should be conducted by research and development departments before actual pr oducts are planned. The objective is to improve the downstream reprodu cibility of new technologies. The technical development of an electron ic circuit is used to explain this proposition.