ATOMIC-SCALE DESORPTION THROUGH ELECTRONIC AND VIBRATIONAL-EXCITATIONMECHANISMS

Citation
Tc. Shen et al., ATOMIC-SCALE DESORPTION THROUGH ELECTRONIC AND VIBRATIONAL-EXCITATIONMECHANISMS, Science, 268(5217), 1995, pp. 1590-1592
Citations number
26
Categorie Soggetti
Multidisciplinary Sciences
Journal title
ISSN journal
00368075
Volume
268
Issue
5217
Year of publication
1995
Pages
1590 - 1592
Database
ISI
SICI code
0036-8075(1995)268:5217<1590:ADTEAV>2.0.ZU;2-R
Abstract
The scanning tunneling microscope has been used to desorb hydrogen fro m hydrogen-terminated silicon (100) surfaces. As a result of control o f the dose of incident electrons, a countable number of desorption sit es can be created and the yield and cross section are thereby obtained . Two distinct desorption mechanisms are observed: (i) direct electron ic excitation of the Si-H bond by field-emitted electrons and (ii) an atomic resolution mechanism that involves multiple-vibrational excitat ion by tunneling electrons at low applied voltages. This vibrational h eating effect offers significant potential for controlling surface rea ctions involving adsorbed individual atoms and molecules.