T. Zhang et al., THE EFFECTS OF MG AND NB IMPLANTATION ON MEAN GRAIN-SIZE OF SNO2 THIN-FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 122(1), 1997, pp. 59-62
Implantation of Mg and Nb ions into 300 nm thick SnO2 thin films, whic
h were deposited on Si wafers by Ar ion sputtering SnO2 targets, was p
erformed. These films were subjected to annealing in an air atmosphere
at 500 degrees C for 4 h. XRD and XPS analyses of films were conducte
d. It was found that Mg implantation prevented grains of SnO, thin fil
ms from growing in subsequent annealing, and conversely for Nb implant
ation.