A. Baschirotto et al., EFFECTS OF NEUTRON FLUENCES UP TO 10(16) N CM(2) AND GAMMA-DOSE UP TO5 MRAD ON MONOLITHIC FAST PREAMPLIFIERS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 122(1), 1997, pp. 73-78
A fast bipolar monolithic Charge Sensitive Preamplifier (CSP), impleme
nted in a 2 mu m BiCMOS technology called HF2CMOS, was exposed to neut
ron fluences (phi) of up to about 10(16) n/cm(2) and photons of up to
5 Mrad. An increasing degradation of the base spreading resistance, r(
bb') as well as increased parallel noise of the input NPN transistor a
nd the PMOS transistor of the second stage of the CSP, was observed fo
r phi > 10(14) n/cm(2). The increase of r(bb') was found to be consist
ent with a decrease of carrier concentration in the base region, after
maximum neutron irradiation.