FRICTIONAL EFFECTS IN ATOMIC-FORCE MICROSCOPY OF LANGMUIR-BLODGETT-FILMS

Authors
TENGROTENHUIS E VANMILTENBURG JC VANDEREERDEN JP
Citation
E. Tengrotenhuis et al., FRICTIONAL EFFECTS IN ATOMIC-FORCE MICROSCOPY OF LANGMUIR-BLODGETT-FILMS, Scanning, 17(3), 1995, pp. 192-195
Citations number
14
Categorie Soggetti
Microscopy
Journal title
Scanning → ACNP
ISSN journal
01610457
Volume
17
Issue
3
Year of publication
1995
Pages
192 - 195
Database
ISI
SICI code
0161-0457(1995)17:3<192:FEIAMO>2.0.ZU;2-T
Abstract
Frictional effects in atomic force microscopy (AFM) of Langmuir-Blodge tt films of 1,2-dipalmitoyl-sn-glycero-phosphoglycerol were examined. Height measurements of the Langmuir layers are strongly influenced by the orientation of the cantilevers used in AFM relative to the sample. A simple model is used to describe the frictional effects and to calc ulate the real height of the monolayers.