Ap. Hitchcock et T. Tyliszczak, SURFACE STUDIES BY CORE-EXCITATION REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY, Surface review and letters, 2(1), 1995, pp. 43-61
Inelastic electron scattering in a reflection geometry is a useful alt
ernative to synchrotron radiation X-ray absorption spectroscopy for in
ner-shell excitation studies of surfaces. This article reviews the cur
rent capabilities of reflection electron energy loss spectroscopy for
core-excitation studies of the electronic and geometric structure of s
urfaces. Issues discussed include: momentum transfer dependence, compa
rison to X-ray techniques, orientational sensitivity, spatial and ener
gy resolution, and technological applications. Examples of application
s to clean surfaces, atomic and molecular adsorbates, and thin films a
re given.