D. Bisello et al., METAL-RESISTIVE LAYER-SILICON (MRS) AVALANCHE DETECTORS WITH NEGATIVEFEEDBACK, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 360(1-2), 1995, pp. 83-86
The main electrical characteristics at room temperature of metal-resis
tive layer-semiconductor avalanche detectors are presented for devices
with a Ti/SiC/p-Si structure. The device response has been tested by
using a Sr-90 source. The consequences on the device behavior induced
by substrate inhomogeneities have been modeled, and compared with thos
e occurring in conventional Avalanche Photo Diodes (APD).