Vv. Dyakin et al., OXYGEN STOICHIOMETRY AND SURFACE-TREATMENT EFFECT ON ELECTROMIGRATIONSTABILITY OF HIGH-T-C TL2BA2CUO6+X SUPERCONDUCTOR, Journal of materials engineering and performance, 4(3), 1995, pp. 248-251
Electromigration stability of Tl2Ba2CuO6+x ceramics is shown to decrea
se significantly when the material is treated in water vapor atmospher
e. The T-c decrease in these samples is accompanied by a resistance in
crease, while the Seebeck coefficient, S, remains unchanged, The autho
rs conclude that the main effect comes from grain-boundary degradation
under the water vapor treatment. For initial samples, electromigratio
n stability strongly depends on the sample oxygen doping level and inc
reases for materials with higher oxygen content. The effect is assumed
to be due to the filling of interstitials in Tl-O layers by oxygen at
oms.