In this work, we report the results of structural optical and electric
al properties of the ZnO semiconductors thin layers doped with indium
in the spray solution ([In]/[Zn] = 0 - 3 % at.) and prepared by the ai
rless spray technique. X-ray diffraction analysis showed that these la
yers prepared at a substrate temperature of 420 degrees C, are well cr
ystallized and oriented preferentially in the (002) direction. For 1 m
u m thick airless spray ZnO thin layer, the study of the optical prope
rties from reflection and transmission spectra indicates a high value
of the transmission (congruent to 80 %), the band gap energy is about
3.2 eV and the reflection index is equalto 1.7 in the transparency ran
ge. On the other hand, indium-doped ZnO thin layers for a ratio 3 % at
., in the spray solution, have a low value of resistivity of the order
of 7.10(-4) Ohm.cm.