DEPENDENCE OF MICROWAVE SURFACE-RESISTANCE ON THE STRUCTURE OF LASER-DEPOSITED YBA2CU3O7-X THIN-FILMS

The effect of the structure YBa2Cu3O7-x, superconducting thin films on microwave surface resistance was investigated. The electon channeling patterns (ECPs) and X-ray experimental results showed that the microw ave surface resistance R(s) is strongly correlated with the perfection of the thin films. The films were deposited on LaAlO3(100) and YSZ(10 0) substrates. For thin film with R(s) of 280 mu Omega, the crystallin ity of the thin film shown by w-scanning and phi-scanning was excellen t and the ECPs were very sharp. For thin film with high R(s) of 98 m O mega, only bands from the major zone were visible in the ECPs, which s uggested poor crystallinity of the him. From this investigation it was shown that the more perfect the thin films, the lower the R(s).