AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE FOR USE AT VARIABLE-TEMPERATURE FROM 18 TO 400 K (VOL 65, PG 3204, 1994)

Citation
S. Horch et al., AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE FOR USE AT VARIABLE-TEMPERATURE FROM 18 TO 400 K (VOL 65, PG 3204, 1994), Review of scientific instruments, 66(6), 1995, pp. 3717-3717
Citations number
1
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
66
Issue
6
Year of publication
1995
Pages
3717 - 3717
Database
ISI
SICI code
0034-6748(1995)66:6<3717:AUSTMF>2.0.ZU;2-8