SILICON PN JUNCTION IMAGING AND CHARACTERIZATIONS USING SENSITIVITY ENHANCED KELVIN PROBE FORCE MICROSCOPY

Authors
KIKUKAWA A HOSAKA S IMURA R
Citation
A. Kikukawa et al., SILICON PN JUNCTION IMAGING AND CHARACTERIZATIONS USING SENSITIVITY ENHANCED KELVIN PROBE FORCE MICROSCOPY, Applied physics letters, 66(25), 1995, pp. 3510-3512
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
25
Year of publication
1995
Pages
3510 - 3512
Database
ISI
SICI code
0003-6951(1995)66:25<3510:SPJIAC>2.0.ZU;2-C