TEMPERATURE-DEPENDENT HOLE FLUENCE TO BREAKDOWN IN THIN GATE OXIDES UNDER FOWLER-NORDHEIM ELECTRON-TUNNELING INJECTION

Authors
SATAKE H TORIUMI A
Citation
H. Satake et A. Toriumi, TEMPERATURE-DEPENDENT HOLE FLUENCE TO BREAKDOWN IN THIN GATE OXIDES UNDER FOWLER-NORDHEIM ELECTRON-TUNNELING INJECTION, Applied physics letters, 66(25), 1995, pp. 3516-3517
Citations number
3
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
66
Issue
25
Year of publication
1995
Pages
3516 - 3517
Database
ISI
SICI code
0003-6951(1995)66:25<3516:THFTBI>2.0.ZU;2-I